Learn about the 7 most common types of atomic force microscopy (AFM) modes. Explore how AFM is used for nanotechnology research and in various fields.
Introduction
Atomic force microscopy (AFM) is a type of scanning probe microscopy that enables the imaging of materials on the nanoscale level. AFM is an essential tool for nanotechnology research, as it provides high-resolution imaging of surfaces and materials. AFM works by scanning a probe over the surface of a sample and measuring the interaction forces between the probe and the sample.
Common types of AFM modes
There are several modes of AFM that are commonly used to image and analyze different types of samples. In this article, we will discuss seven of the most common types of AFM modes.
Contact Mode
Contact mode is the simplest and most commonly used AFM mode. In this mode, the probe is in constant contact with the sample surface while it is scanned. The probe tip is deflected by the interaction forces between the tip and the sample, and these deflections are used to create an image of the sample surface.
Tapping Mode
Tapping mode is also known as intermittent contact mode. In this mode, the probe oscillates perpendicular to the sample surface at a resonant frequency. The tip intermittently taps the surface, which reduces the interaction forces between the tip and the sample. Tapping mode is useful for imaging soft samples, as it reduces the damage to the sample surface.
Non-Contact Mode
Non-contact mode is similar to tapping mode, but the probe is kept at a distance from the sample surface. The interaction forces between the tip and the sample are much weaker in
