Learn about the three most common types of electron microscopy techniques: TEM, SEM, and STEM. Discover their applications and limitations in this article.

3 Most Common Types of Electron Microscopy Techniques

Electron microscopy is a powerful imaging technique used in the field of nanotechnology and material science. It uses electrons instead of light to create high-resolution images of a sample’s surface, interior, and composition. There are various types of electron microscopy techniques, but in this article, we will discuss the three most common ones: transmission electron microscopy (TEM), scanning electron microscopy (SEM), and scanning transmission electron microscopy (STEM).

Transmission Electron Microscopy (TEM)

Transmission electron microscopy (TEM) is a widely used technique for imaging the internal structure of materials at high resolution. In TEM, a beam of electrons passes through a thin sample, and an image is formed by measuring the electron transmission through the sample. The sample needs to be very thin, typically less than 100 nanometers thick, to allow the electrons to pass through it.

TEM can provide atomic-level resolution images of the sample, making it a powerful tool for studying the structure and composition of materials. It is commonly used in the study of biological samples, such as viruses and cells, as well as in the study of materials science, such as metals, ceramics, and semiconductors.

Scanning Electron Microscopy (SEM)

Scanning electron microscopy (SEM) is another commonly used electron microscopy technique that is used to produce high-resolution images of a sample’s surface. In SEM, a beam of electrons is scanned over the surface of a sample, and the electrons that are scattered back are detected to create an image.

SEM can provide three-dimensional images of the sample’s surface, making it a